|
New analyzer handles latest technologies with test times up to four times faster for higher throughput and greater productivity
ISSAQUAH, Wash. - April 16, 2002 - Applied Precision now offers the PrecisionPointTM VX3 Probe Card Analyzer, a new system that can reduce probe card test times by up to 50 percent. Building upon the reliable alignment, planarity and electrical test data that made the PrecisionPoint VX2 system the industry-leading favorite, the new VX3 analyzer offers expanded applications for manufacturing, testing and reworking of the industry’s most advanced probe card technologies, including multi-DUT, radius, cobra, cantilever, vertical, microspring and membrane technologies.
The VX3 Probe Card Analyzer’s flexibility makes it a superior choice for every probe card manufacturer and fab, including those producing or using the most current large memory cards. The VX3 has a 375 to 4500 Test Channel capability, plus up to 375 Relay Channels. The system is available with many checkplate options to suit different processes and technology, including newly designed Quad-Dot and membrane technology checkplates.
New developments and enhancements have increased the system's efficiency and testing speed for leakage, planarity, alignment, CRes, gram-probe force and for validation of the electrical configuration of new probe cards. New options include a choice of new "Hi-Speed" optics, which provide a 100 percent increase in alignment speed, or "Hi-Res" optics for the latest small-tip, small-pitch technologies.
The VX3's software-controlled counterweight provides the operator with the industry’s fastest and most efficient rework feature, allowing access from either side of even the largest and most complex probe cards. The system enables the retest and test failure operations to be fully automated, reducing the complexity of operation. Other new features include easier and faster location of individual probes for increased rework accuracy, and automatic probe card identification, enabling operators to track each probe card through the testing process, thereby preventing the use of untested cards on the test floor.
Applied Precision’s Semiconductor Product Line Manager Bob Heiligenberg comments, "The vast majority of probe card manufacturers and fabs around the world rely daily on PrecisionPoint analyzers to ensure repeatable, dependable performance on their build and test floors 24/7, and the VX3 system continues this tradition of excellence with faster and more accurate testing for higher throughput." The PrecisionPoint VX3 system is backward compatible with all custom interface test fixtures (motherboards) used on both the VX and VX2 models. All of Applied Precision’s PrecisionPoint VX and VX2 products can be upgraded to the VX3. The PrecisionPoint VX3 system will begin shipping in July 2002.
About Applied Precision, LLC
Applied Precision develops measurement, analysis and process control systems for semiconductor wafer test, biomedical and biotechnology imaging and analysis systems (especially live-cell microscopy, genomics and proteomics), and precision motion control components. Applied Precision's specialized products are based on precisionwareTM, the company's unique convergence of mechanics, electronics, optics and software. Applied Precision, LLC has been enabling advancements in the world's core technologies since its inception in 1985. Applied Precision (www.appliedprecision.com) can be reached in the United States at (425) 557-1000 or in the United Kingdom at +44 1672 518350.
Contacts:
For Applied Precision
BRW LeGrand
Lisa Miller or Jason Rodman
Tel: 303.298.8470
E-mail: lmiller@brwlegrand.com
Applied Precision
Bob Heiligenberg, Product Line Manager - Semiconductor Solutions
Tel: 425.557.1000
E-mail: bheiligenberg@api.com
|
