Press Releases
| APPLIED PRECISION DEMONSTRATES "CLOSED-LOOP" METROLOGY AT SEMICON EUROPA |
Applied Precision is excited to participate in SEMICON Europa, April 4-6 in Munich, Germany.
We invite you to visit us in Hall A2 at Booth #342 to see a demonstration of the waferWoRx™ Probing Process Analysis System. The waferWoRx system improves the probing process with instantaneous data collection and analysis of probe marks.
Also, see an alpha version of the microBurst™ Contact Resistance Reduction System. The microBurst system enables chemical and contact-free non-destructive removal of oxidation from probe card needles in a fully automated process.
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