Applied Precision Customers Agilent, Motorola and Texas Instruments Present at Southwest Test Workshop 2000
Sunday, June 11 to Wednesday, June 14, 2000, San Diego
Applied Precision is pleased to be giving several technical presentations at this year's Southwest Test Workshop. Applied Precision employees will be presenting on new methods in probing process analysis and improvement, and understanding contact resistance. Applied Precision's customers, including Agilent, Motorola and Texas Instruments, will present on probe card cleaning, probe mark analysis and probe contact resistance; all are processes for which they use Applied Precision's products.
Monday, June 12
9:30 am |
"Electrohydrodynamic (EHD) Cleaning to Reduce Device Yield Fallout at Wafer Level Test"
- Jerry Broz, Texas Instruments
- Rey Rincon, Texas Instruments
- Jim Andersen, Applied Precision
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Monday, June 12
2:30 pm
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"Probing Process Analysis and Continuous Improvement"
- John Strom, Applied Precision
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Tuesday, June 13
9:30 am
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"Improving your Probing Process through Probe Mark Analysis"
- Tony Angelo, Motorola
- Bill Williams, Motorola
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Wednesday, June 14
8:00 am
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"Understanding contact resistance between different probe tips and contact surfaces"
- Brett Crump, Applied Precision
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Wednesday, June 14
8:30 am
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"Probe Contact Resistance Mechanisms"
- Dale Gleason, Agilent Technologies
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Visit www.swtest.org to view this year's Southwest Test Workshop schedule of presentations and events.
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