Press Releases
| APPLIED PRECISION INTRODUCES NEW METROLOGY PRODUCTS AT SEMICON WEST |
Wednesday, July 12 to Friday, July 14, 2000, San Jose Convention Center
Applied Precision will be exhibiting at this year's SEMICON West in San Jose, California. Please join us at booth 10536 to see demonstrations of:
waferWoRx Probing Process Analysis System
Applied Precision's waferWoRx™ Probing Process Analysis System improves the probing process with instantaneous data collection and analysis of the wafer's scrub marks. The waferWoRx system prescribes corrective action based on quantifiable data and analysis for the prober, probe card and probe card analyzer.
microBurst Contact Resistance Reduction System
The microBurst Contact Resistance Reduction System utilizes microcluster beam technology to remove the oxidation layer from probe card needles. The microBurst system is the first and only non-contact, non-destructive and non-chemical process developed for contact resistance reduction.
PrecisionPoint VX2 Probe Card Analyzer with New 4500 Channel Extension
Applied Precision's PrecisionPoint VX2 Probe Card Analyzer allows manufacturing, testing and rework of advanced probe card technologies. The new Extension option has the highest channel count (4500) and probe test capability (8000) of any probe card analyzer on the market, enabling efficient and extremely accurate testing of next-generation, ASIC and advanced memory multi-DUT probe cards. The 4500-channel Extension will be available as both an option on a new system and as an upgrade to our installed base.
Visit www.semi.org to view the schedule of events and exhibitors for SEMICON West 2000.
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