| First-of-its-kind probing process analysis system will go to Beta in late April; final product ready September 2000
SEMICON Europa, Booth # A2.342 Munich, Germany - April 4, 2000 - Applied Precision, Inc. is entering the alpha testing phase of the waferWoRx Probing Process Analysis System with help from Motorola (NYSE: MOT), a global leader in providing integrated communications solutions and embedded electronic solutions. Applied Precision's waferWoRx System is designed to improve the wafer probing process with instantaneous data collection and analysis.
As an Alpha user of Applied Precision's waferWoRx, Motorola provides feedback on the system's functionality based on its performance as a metrology tool to analyze new probe designs and technologies in its Chandler, Ariz., production facility. Motorola will also work with Applied Precision to prioritize future software modules to expand the capabilities of the waferWoRx system.
"Motorola's input is critical in the rapid development of this system," said Bob Heiligenberg, Product Marketing Manager. "As microchips get smaller and faster, leading to smaller bonding pads and pitch sizes, the semiconductor industry needs to continually improve its probe process testing capabilities. The waferWoRx system is the only probing process analysis system that is able to collect, analyze and correlate data from the prober, probe card and probe card analyzer, and prescribe corrective actions for test floor engineers."
The waferWoRx system evaluates the probing process by analyzing probe marks with advanced image analysis software. The combined analysis of data from the prober, probe card and probe card analyzer - called "closed-loop" metrology correlation - makes it possible to prescribe corrective actions that optimize probing performance including test-at-temperature, accuracy of prober stage setup and prober to prober consistency. Additionally, data from the waferWoRx system can help support the next generation of chips by accurately predicting wafer test capability for future probing processes. This information will also assist in planning for future capital equipment investments for the test floor.
"We are always seeking to improve our technology capabilities by improving our wafer test systems, and as we examined the alternatives available for improvement, we found that Applied Precision had the expertise in this area to help us continue to perform at our best," said Tony Angelo, probe engineer of Motorola Semiconductor Products Sector.
Bill Williams, manager of the FMTC Wirebond Probe Technology Development Department of Motorola Semiconductor Products Sector, continued, "waferWoRx is an innovative solution to the various probing process issues that could impact our fab throughput, and we expect waferWoRx to give us a clearer understanding than we've ever had before of how our process is functioning."
Motorola has purchased the final version of waferWoRx, scheduled to be available in September 2000. In addition to the Alpha testing currently underway, Motorola will receive a Beta version of waferWoRx in late April 2000 for further refinement of the system's functionality.
About Applied Precision, Inc.
Applied Precision (www.api.com), develops measurement, analysis and process-control systems for semiconductor test, assembly and packaging, as well as for biomedical and biotechnology imaging and analysis (especially cell microscopy, genomics and proteomics). Applied Precision's specialized systems are based on precisionware, the company's unique convergence of mechanics, electronics, optics and software, enabling advancements in the world's core technologies. Applied Precision can be reached in the United Kingdom at +44 1672 518350 or in the United States at (425) 557-1000.
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